soft errors

This paper describes main failure mechanism for MOS VLSI, Thin oxide breakdown, hot carrier effect, Al-Si contact failure, electromigration and soft errors. It gives out some technical measures to prevent above-mentioned failures.

本文论述了MOS VLSI主要失效机理，即薄氧化层击穿、热载流子效应、铝－硅接触失效、电迁移以及软错误，并给出了预防上述失效的一些技术措施。

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In this paper, we propose a new methodology to analyze the soft errors in SRAM-based FPGAs.

本文中提出了一种新的方法，可以用来分析单粒子翻转对构建在FPGA上的系统造成的影响。

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Although backup can deal with soft errors, we can not avoid data loss since backup always be done in period.

备份技术可以处理软错误，但是由于备份是周期性的，无法做到完全的数据无损失。

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Because soft errors are not detectable directly by a server instance, a soft error could potentially cause a server instance to wait indefinitely.

由于软错误不能由服务器实例直接检测到，因此，可能导致服务器实例不确定地等待某个响应。

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Hardware failure and soft errors which were caused by human are two major threats to data security.

对数据安全的威胁主要有硬件的错误和人为因素导致的软错误。

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Noise analysis of soft errors in multiple output combinational logic systems

多输出组合逻辑系统中软故障的分析

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They are based on extended Hamming Code and Cycle Redundancy Code, and designed to tolerant the soft errors happens in the links.

本文针对片上网络的链路上发生的软错误，利用扩展海明码和循环校验码，设计和实现了四种点到点的容错机制。

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